| PRODUCT LIST |
| ANALYZER SYSTEMS SERIES |
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 STAMPER ANALYZER - STT |
OVERVIEW
The stamper analyser provides defect inspection of the entire surface area and random measurementof selected area(s).
KEY FEAURES
The stamper analyser provides defect inspection of the entire surface area and random measurementof selected area(s).
1. Inspections Inspecting some defect inspection items. RF Signal, Wobble Signal Amplitude Tracking and Focusing Error Signal
2. Measurements Measuring many items on Orange Book. Already supported Orange Book part 2: CD-R Ver. 3.1 and Orange Book part 3: CD-RW Ver. 2.0
3. Graph and Mapping The Testing results can be shown with the graph and the mapping.
4. Multi-point calibration function
5. Calibration process back-up and traceability function
6. One Drive for CD-R, CD-RW and CD-ROM stampers
7. High Cost Performance All Inspections and Measurement functions can be tested by the standard system.
8. Additional Functions You no longer need separate euqipments for TIA, Specter Analysisr and Jitter Metering.
TYESTING TYPE AND TESTING ITEMS
Defect Inspection
Testing Speed: 1X, 2X, 4X
Testing Items* (CD-R/RW) : ECC, RF, Iw, NWS, RN, Wobble, TE, FE, ATIP, ATIPBL, DEV, Rg, Rl, TE, PPM, RCb, WCNR, Ig/Il
Testing Items* (CD-ROM) : Rg, Rl, TE, PPM, RCa, CT, RN, Rtop, m3, m11, I3/I11, Asymm, Beta, Jitter, Length, C1Total, C2Total, CuTotal, C1Ave, C1Max, C2max, CuMax, C1BL
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